Broad-Band Difference Interferometer

Thanks to researches and the development of integrated optics devices for optical applications in the telecommunications, relatively cheap sources and detectors of optical radiation that can be used in the design of planar optical sensors [1, 2]. One of the commonly used sensor systems is the differential interferometer, based on planar waveguides [3]. In the analyzed system propagates a mode for wavelengths from 450 nm to 600 nm. This type of arrangement is shown in [4-6] and called “frequencyresolved”, “broad-band” or “wavelength interrogation” Mach-Zehnder interferometer. This abstract presents the idea of a spectropolarimetric differential interferometer in which the recorded signal indicates the spectral distribution recorded at the output of the structure. Any change in the condition of propagation results in the case in a change of the recorded spectral distribution. In the case of an interference of the modes TE0 and TM0 and the same optical power density I0 is transmitted in both modes, the signal recorded by the detector I (t) can be expressed by the formula [3]: